We are pleased to offer procurement for Northrop Grumman Systems Corporation part number A3084414 here on NSN Portal, a Semiconductor Devic product that is listed with the NSN 5961-01-336-5490 for ease of identification. You have reached our Request for Quote (RFQ) form for this listing, where you are encouraged to submit details on your requirements to receive tailored purchasing options from our staff. As you will see, we ask that you offer key information on your pricing target, desired quantity, and more, as this will ensure that the representative who responds to your request is able to provide the most fitting solutions for your needs.
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Whether you procure part number A3084414 or other NSN products from our website, you can rest assured that we uphold full traceability for all items. For example, this particular listing traces back to Northrop Grumman Systems Corporation through the CAGE Code 26916, as well as falls under FSC 5961 Semiconductor Devices and Associated Hardware based on having the NSN 5961-01-336-5490. Furthermore, every purchase will be delivered with any applicable qualifying certifications or manufacturer trace documentation as per our NO CHINA SOURCING pledge. If you are ready to experience why professionals rely on us for their needs, request a quote for part number A3084414 today and take advantage of our industry-leading services.
NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5961-01-336-5490 Item PartTypeName: SEMICONDUCTOR DEVICE SET | 5961 | 013365490 | 0 | N | B | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
U | B | A | ||||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
JANTX1N4454-1 | 5 | 1 | 5 |
MRC | Criteria | Characteristic |
---|---|---|
ABBH | INCLOSURE MATERIAL | GLASS ALL SEMICONDUCTOR DEVICE DIODE |
ABHP | OVERALL LENGTH | 0.140 INCHES MINIMUM AND 0.180 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
AGAV | END ITEM IDENTIFICATION | 5841-01-236-8951 DETECTING SET R AN/APR-39A(V)1 |
ASKA | COMPONENT NAME AND QUANTITY | 2 SEMICONDUCTOR DEVICE DIODE |
CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 50.0 MAXIMUM WORKING PEAK REVERSE VOLTAGE,MAXIMUM PEAK TOTAL VALUE ALL SEMICONDUCTOR DEVICE DIODE |
ABJT | TERMINAL LENGTH | 1.000 INCHES MINIMUM AND 1.500 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
ADAV | OVERALL DIAMETER | 0.056 INCHES MINIMUM AND 0.075 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
AXGY | MOUNTING METHOD | TERMINAL ALL SEMICONDUCTOR DEVICE DIODE |
TTQY | TERMINAL TYPE AND QUANTITY | 2 UNINSULATED WIRE LEAD ALL SEMICONDUCTOR DEVICE DIODE |
AFZC | FUNCTION FOR WHICH DESIGNED | SWITCHING |
ALAZ | JOINT ELECTRONIC DEVICE ENGINEERING COUNCIL/JEDEC/CASE OUTLINE DESIGNATION | DO-35 ALL SEMICONDUCTOR DEVICE DIODE |
ASDD | COMPONENT FUNCTION RELATIONSHIP | MATCHED |
CTMZ | SEMICONDUCTOR MATERIAL | SILICON ALL SEMICONDUCTOR DEVICE DIODE |
CTQX | CURRENT RATING PER CHARACTERISTIC | 225.00 MILLIAMPERES MAXIMUM FORWARD CURRENT,DC AND 75.00 MILLIAMPERES MAXIMUM AVERAGE FORWARD CURRENT AVERAGED OVER A FULL 60-HZ CYCLE ALL SEMICONDUCTOR DEVICE DIODE |
CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 150.0 DEG CELSIUS AMBIENT AIR ALL SEMICONDUCTOR DEVICE DIODE |
ALAS | INTERNAL CONFIGURATION | JUNCTION CONTACT ALL SEMICONDUCTOR DEVICE DIODE |
ASCQ | INTERNAL JUNCTION CONFIGURATION | PN ALL SEMICONDUCTOR DEVICE DIODE |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED CASE AND ELECTROSTATIC SENSITIVE |
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