We are pleased to offer procurement for General Dynamics Mission Systems part number 15-1326286-1 here on NSN Portal, a Microcircuit Memory product that is listed with the NSN 5962-01-375-7492 for ease of identification. You have reached our Request for Quote (RFQ) form for this listing, where you are encouraged to submit details on your requirements to receive tailored purchasing options from our staff. As you will see, we ask that you offer key information on your pricing target, desired quantity, and more, as this will ensure that the representative who responds to your request is able to provide the most fitting solutions for your needs.
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Whether you procure part number 15-1326286-1 or other NSN products from our website, you can rest assured that we uphold full traceability for all items. For example, this particular listing traces back to General Dynamics Mission Systems through the CAGE Code 04655, as well as falls under FSC 5962 Microcircuits Electronic based on having the NSN 5962-01-375-7492. Furthermore, every purchase will be delivered with any applicable qualifying certifications or manufacturer trace documentation as per our NO CHINA SOURCING pledge. If you are ready to experience why professionals rely on us for their needs, request a quote for part number 15-1326286-1 today and take advantage of our industry-leading services.
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5962-01-375-7492 Item PartTypeName: MICROCIRCUIT,MEMORY | 5962 | 013757492 | 0 | N | B | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| 7 | B | A | 0 | |||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| 15-1326286-1 | 5 | 2 | 3 |
| MRC | Criteria | Characteristic |
|---|---|---|
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.6 VOLTS MINIMUM TOTAL SUPPLY AND 7.0 VOLTS MAXIMUM TOTAL SUPPLY |
| CZER | MEMORY DEVICE TYPE | EPROM |
| SPCL | SPECIAL TEST FEATURES | SELECTED AND TESTED FOR RADIATION HARDNESS |
| ADAT | BODY WIDTH | 0.585 INCHES MINIMUM AND 0.605 INCHES MAXIMUM |
| AFGA | OPERATING TEMP RANGE | -55.0/125.0 DEG CELSIUS |
| CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| CRTL | CRITICALITY CODE JUSTIFICATION | FEAT |
| CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | MICROCIRCUIT,PROM,128K X 8 (27C010); MICROCIRCUIT,MEMORY DIGITAL,CMOS 128K X 8-BIT UVEPROM,MONOLITHIC SILICON |
| CZZZ | MEMORY CAPACITY | 128K X 8 |
| FEAT | SPECIAL FEATURES | ELECTROSTATIC DISCHARGE SENS/HARDNESS CRITICAL ITEM; SELECTED ITEM; SELECTED FROM P/N 5962-8961404MXX OR 5962-8961405MXX,CAGE 67268 |
| NHCF | NUCLEAR HARDNESS CRITICAL FEATURE | HARDENED |
| TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC.). |
| TTQY | TERMINAL TYPE AND QUANTITY | 32 PRINTED CIRCUIT |
| ADAQ | BODY LENGTH | 1.660 INCHES MINIMUM AND 1.680 INCHES MAXIMUM |
| CBBL | FEATURES PROVIDED | BURN IN,MIL-STD-883,CLASS B AND ELECTROSTATIC SENSITIVE AND MONOLITHIC AND RADIATION HARDENED AND ULTRAVIOLET ERASABLE AND TESTED TO MIL-STD-883 AND SELECTED ITEM |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 5.00 MICROAMPERES MAXIMUM INPUT |
| CZEQ | TIME RATING PER CHACTERISTIC | 150.00 NANOSECONDS MINIMUM ACCESS AND 170.00 NANOSECONDS MAXIMUM ACCESS |
| ADAU | BODY HEIGHT | 0.200 INCHES MINIMUM AND 0.220 INCHES MAXIMUM |
| AEHX | MAXIMUM POWER DISSIPATION RATING | 330.0 MILLIWATTS |
| AFJQ | STORAGE TEMP RANGE | -65.0/150.0 DEG CELSIUS |
| AGAV | END ITEM IDENTIFICATION | HAC/RMPE REACT BASIC |
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